광주광역시 북구 용봉로 77 전남대학교 공과대학 6호관 717호 | ylee@jnu.ac.kr

Conferences

국제학회 (International Conferences)

  1. “Tunable Compact Probing Detector with Fast Analysis Time Against Invasive Attacks”
    Young-woo Lee, Youngkwang Lee, Minho Moon and Sungho Kang
    IEEE International SOC Design Conference (ISOCC)
    October 2019
  2. “2-D failure bitmap compression using line fault marking method”
    Keewon Cho, Young-woo Lee, Sungyoul Seo and Sungho Kang
    IEEE International SOC Design Conference (ISOCC)
    November 2018
  3. “An Efficient Built-in Self-Repair Scheme for Area Reduction”
    Keewon Cho, Young-woo Lee, Sungyoul Seo, and Sungho Kang
    IEEE International SOC Design Conference (ISOCC)
    November 2017 (Honored with Best Paper Award)
  4. “Test Item Priority Estimation for High Parallel Test Efficiency under ATE Debug Time Constraints”
    Young-woo Lee, Inhyuk Choi, Kang-Hoon Oh, James Jinsoo Ko, and Sungho Kang
    IEEE International Test Conference in Asia (ITC-Asia)
    September 2017
  5. “A Test Methodology to Screen Scan-Path Failures”
    Junghwan Kim, Young-woo Lee, Minho Cheong, Sungyoul Seo and Sungho Kang
    IEEE International SOC Design Conference (ISOCC)
    October 2016
  6. “A TSV Test Structure for Simultaneously Detecting Resistive Open and Bridge Defects in 3D-ICs”
    Young-woo Lee, Junghwan Kim, Inhyuk Choi, Sungho Kang
    IEEE International SOC Design Conference (ISOCC)
    October 2016 (Honored with IEEE CASS Seoul Chapter Award)
  7. “A Study on Automatic SPI ROM Version Updates for Production”
    Young-woo Lee, Kang-Hoon Oh, Taehwan Kim
    Teradyne User Group Conference (Orlando, FL)
    May 2015
  8. “A Study on SPI ROM Write Function with DSSC”
    Young-woo Lee, Kang-Hoon Oh
    Teradyne User Group Conference (Anaheim, CA)
    April 2014
  9. “A Study on SPI ROM Slave Protocol Aware”
    Young-woo Lee, Kang-Hoon Oh, Hyoung-Mo Choi, James Paik
    Teradyne User Group Conference (Fort Worth, TX)
    April 2013
  10. “New Test Technique for Substituting Serial Measurement with Matrix Measurement”
    Young-woo Lee, Kang-Hoon Oh, Kyung-Kuk Moon
    Teradyne User Group Conference (Fort Worth, TX)
    April 2013
  11. “ADC Test with UltraPin1600 Source Synchronous Method”
    Young-woo Lee, Kang-Hoon Oh, Eun-woo Park, Byung-hwa Lee
    Teradyne User Group Conference (Hilton Head, SC)
    May 2012